Metal gate work function engineering on gate leakage of...

IEEE Transactions on Electron Devices 2004 Vol. 51; Iss. 11

Metal gate work function engineering on gate leakage of MOSFETs

Yong-Tian Hou, Ming-Fu Li, Low, T., Dim-Lee Kwong
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2004
Language:
english
Pages:
7
DOI:
10.1109/ted.2004.836544
File:
PDF, 524 KB
english, 2004
Conversion to is in progress
Conversion to is failed