NVM characteristics of single-MOSFET cells using nitride spacers with gate-to-drain NOI
Chien-Sheng Hsieh, Pai-Chu Kao, Chia-Sung Chiu, Chih-Hsueh Hon, Chen-Chia Fan, Wei-Chain Kung, Zih-Wun Wang, Jeng, E.S.Volume:
51
Year:
2004
Language:
english
Pages:
7
DOI:
10.1109/ted.2004.836796
File:
PDF, 818 KB
english, 2004