Low-frequency noise measurements as an investigation tool...

IEEE Transactions on Electron Devices 2005 Vol. 52; Iss. 5

Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg0.7Cd0.3Te focal plane arrays

Perez, J.-P., Myara, M., Alabedra, R., Orsal, B., Leyris, C., Tourrenc, J.-P., Signoret, P.
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Volume:
52
Year:
2005
Language:
english
Pages:
6
DOI:
10.1109/ted.2005.846328
File:
PDF, 603 KB
english, 2005
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