Positive temperature coefficient of impact ionization in...

IEEE Transactions on Electron Devices 2005 Vol. 52; Iss. 7

Positive temperature coefficient of impact ionization in strained-Si

Waldron, N.S., Pitera, A.J., Lee, M.L., Fitzgerald, E.A., del Alamo, J.A.
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Volume:
52
Year:
2005
Language:
english
Pages:
7
DOI:
10.1109/ted.2005.850620
File:
PDF, 412 KB
english, 2005
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