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Reliability evaluation of class-E and class-a power amplifiers with nanoscaled CMOS technology
Wei-Cheng Lin, Tsung-Chien Wu, Yi-Hung Tsai, Long-Jei Du, Ya-Chin KingVolume:
52
Year:
2005
Language:
english
Pages:
6
DOI:
10.1109/ted.2005.850639
File:
PDF, 565 KB
english, 2005