Modeling of statistical low-frequency noise of...

IEEE Transactions on Electron Devices 2005 Vol. 52; Iss. 7

Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs

Wirth, G.I., Jeongwook Koh, da Silva, R., Thewes, R., Brederlow, R.
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Volume:
52
Year:
2005
Language:
english
Pages:
13
DOI:
10.1109/ted.2005.850955
File:
PDF, 765 KB
english, 2005
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