Noise characteristics of InGaP-gated PHEMTs under high current and thermal accelerated stresses
Hou-Kuei Huang, Chou-Sheng Wang, Chieh-Ping Chang, Yeong-Her Wang, Chang-Luen Wu, Chian-Sern ChangVolume:
52
Year:
2005
Language:
english
Pages:
7
DOI:
10.1109/ted.2005.852176
File:
PDF, 601 KB
english, 2005