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DC performance of deep submicrometer Schottky-gated n-channel Si:SiGe HFETs at low temperatures
Gaspari, V., Fobelets, K., Velazquez-Perez, J.E., Hackbarth, T.Volume:
52
Year:
2005
Language:
english
Pages:
8
DOI:
10.1109/ted.2005.855059
File:
PDF, 362 KB
english, 2005