RF performance and modeling of Si/SiGe resonant interband...

IEEE Transactions on Electron Devices 2005 Vol. 52; Iss. 10

RF performance and modeling of Si/SiGe resonant interband tunneling diodes

Niu Jin, Sung-Yong Chung, Ronghua Yu, Di Giacomo, S.J., Berger, P.R., Thompson, P.E.
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Volume:
52
Year:
2005
Language:
english
Pages:
7
DOI:
10.1109/ted.2005.856183
File:
PDF, 601 KB
english, 2005
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