Processing aspects in the low-frequency noise of nMOSFETs...

IEEE Transactions on Electron Devices 2006 Vol. 53; Iss. 5

Processing aspects in the low-frequency noise of nMOSFETs on strained-silicon substrates

Simoen, E., Eneman, G., Verheyen, P., Loo, R., Kristin De Meyer, Claeys, C.
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Volume:
53
Year:
2006
Language:
english
Pages:
9
DOI:
10.1109/ted.2006.871859
File:
PDF, 496 KB
english, 2006
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