Fast Vth Instability in HfO2 Gate Dielectric MOSFETs and...

IEEE Transactions on Electron Devices 2006 Vol. 53; Iss. 12

Fast Vth Instability in HfO2 Gate Dielectric MOSFETs and Its Impact on Digital Circuits

Chen Shen, Tian Yang, Ming-Fu Li, Xinpeng Wang, C. E. Foo, Ganesh S. Samudra, Yee-Chia Yeo, Dim-Lee Kwong
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Volume:
53
Year:
2006
Language:
english
Pages:
11
DOI:
10.1109/ted.2006.885680
File:
PDF, 385 KB
english, 2006
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