RF, DC, and Reliability Performance of MIM Capacitors...

RF, DC, and Reliability Performance of MIM Capacitors Embedded in Organic Substrates by Wafer-Transfer Technology (WTT) for System-on-Package Applications

E. B. Liao, Hongyu Li, L. H. Guo, Guo-Qiang Lo, Rakesh Kumar, N. Balasubramanian, Dim-Lee Kwong
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Volume:
54
Year:
2007
Language:
english
Pages:
8
DOI:
10.1109/ted.2006.890233
File:
PDF, 539 KB
english, 2007
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