An Investigation of Negative Differential Resistance and Novel Collector–Current Kink Effects in SiGe HBTs Operating at Cryogenic Temperatures
Jiahui Yuan, John D. Cressler, Chendong Zhu, Yan Cui, Guofu Niu, Qingqing Liang, Alvin J. JosephVolume:
54
Year:
2007
Language:
english
Pages:
13
DOI:
10.1109/ted.2006.890392
File:
PDF, 427 KB
english, 2007