Temperature Dependence of Substrate and Drain–Currents in...

IEEE Transactions on Electron Devices 2007 Vol. 54; Iss. 5

Temperature Dependence of Substrate and Drain–Currents in Bulk FinFETs

Sang-Yun Kim, Young Min Kim, Kwang-Ho Baek, Byung-Kil Choi, Kyoung-Rok Han, Ki-Heung Park, Jong-Ho Lee
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Volume:
54
Year:
2007
Language:
english
Pages:
6
DOI:
10.1109/ted.2007.894605
File:
PDF, 483 KB
english, 2007
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