Highly Scalable Embedded Flash Memory With Deep Trench...

Highly Scalable Embedded Flash Memory With Deep Trench Isolation and Novel Buried Bitline Integration for the 90-nm Node and Beyond

Tilke, A.T., Pescini, L., Bauer, M., Stiftinger, M., Kakoschke, R., Shum, D., Chan, N., Sungrae Kim, Hecht, V., Kyung Joon Han
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Volume:
54
Year:
2007
Language:
english
Pages:
8
DOI:
10.1109/ted.2007.898040
File:
PDF, 834 KB
english, 2007
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