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Suppression of Dynamic On-Resistance Increase and Gate Charge Measurements in High-Voltage GaN-HEMTs With Optimized Field-Plate Structure
Saito, W., Nitta, T., Kakiuchi, Y., Saito, Y., Tsuda, K., Omura, I., Yamaguchi, M.Volume:
54
Year:
2007
Language:
english
Pages:
6
DOI:
10.1109/ted.2007.901150
File:
PDF, 320 KB
english, 2007