off-State Degradation in Drain-Extended NMOS Transistors:...

IEEE Transactions on Electron Devices 2007 Vol. 54; Iss. 10

off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown

Varghese, D., Kufluoglu, H., Reddy, V., Shichijo, H., Mosher, D., Krishnan, S., Muhammad Ashraful Alam
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Volume:
54
Year:
2007
Language:
english
Pages:
10
DOI:
10.1109/ted.2007.904587
File:
PDF, 910 KB
english, 2007
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