A Pearson Effective Potential for Monte Carlo Simulation of...

IEEE Transactions on Electron Devices 2008 Vol. 55; Iss. 12

A Pearson Effective Potential for Monte Carlo Simulation of Quantum Confinement Effects in nMOSFETs

Jaud, M.-A., Barraud, S., Saint-Martin, J., Bournel, A., Dollfus, P., Jaouen, H.
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Volume:
55
Year:
2008
Language:
english
Pages:
9
DOI:
10.1109/ted.2008.2006116
File:
PDF, 653 KB
english, 2008
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