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Drain Breakdown Voltage in MuGFETs: Influence of Physical Parameters
Lee, C.-W., Afzalian, A., Yan, R., Akhavan, N.D., Weize Xiong, Colinge, J.-P.Volume:
55
Year:
2008
Language:
english
Pages:
4
DOI:
10.1109/ted.2008.2006546
File:
PDF, 668 KB
english, 2008