Modeling and Parameter Extraction for the Series Resistance...

Modeling and Parameter Extraction for the Series Resistance in Thin-Film Transistors

Keum-Dong Jung, Yoo Chul Kim, Byung-Gook Park, Hyungcheol Shin, Jong Duk Lee
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Volume:
56
Year:
2009
Language:
english
Pages:
10
DOI:
10.1109/ted.2008.2010579
File:
PDF, 464 KB
english, 2009
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