A Modified Charge-Pumping Method for the Characterization...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 2

A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs

Daming Huang, Liu, W.J., Zhiying Liu, Liao, C.C., Li-Fei Zhang, Zhenghao Gan, Waisum Wong, Ming-Fu Li
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Volume:
56
Year:
2009
Language:
english
Pages:
8
DOI:
10.1109/ted.2008.2010585
File:
PDF, 632 KB
english, 2009
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