Design Methodology and Protection Strategy for ESD-CDM...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 2

Design Methodology and Protection Strategy for ESD-CDM Robust Digital System Design in 90-nm and 130-nm Technologies

Tze Wee Chen, Ito, C., Loh, W., Wei Wang, Doddapaneni, K., Mitra, S., Dutton, R.W.
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Volume:
56
Year:
2009
Language:
english
Pages:
9
DOI:
10.1109/ted.2008.2010586
File:
PDF, 583 KB
english, 2009
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