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Avalanche Breakdown Due to 3-D Effects in the Impact-Ionization MOS (I-MOS) on SOI: Reliability Issues
Mayer, F., Le Royer, C., Blachier, D., Clavelier, L., Deleonibus, S.Volume:
55
Year:
2008
Language:
english
Pages:
6
DOI:
10.1109/ted.2008.922797
File:
PDF, 593 KB
english, 2008