Understanding and Optimization of Hot-Carrier Reliability...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 5

Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs

Maji, D., Crupi, F., Amat, E., Simoen, E., De Jaeger, B., Brunco, D.P., Manoj, C.R., Rao, V.R., Magnone, P., Giusi, G., Pace, C., Pantisano, L., Mitard, J., Rodriguez, R., Nafria, M.
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Volume:
56
Year:
2009
Language:
english
Pages:
7
DOI:
10.1109/ted.2009.2015854
File:
PDF, 344 KB
english, 2009
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