Experimental Investigation of RF Noise Performance...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 7

Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs

Emam, M., Sakalas, P., Vanhoenacker-Janvier, D., Raskin, J.-P., Tao Chuan Lim, Danneville, F.
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Volume:
56
Year:
2009
Language:
english
Pages:
7
DOI:
10.1109/ted.2009.2021361
File:
PDF, 853 KB
english, 2009
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