High-Voltage CMOS ESD and the Safe Operating Area

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 8

High-Voltage CMOS ESD and the Safe Operating Area

Walker, A.J., Puchner, H., Dhanraj, S.P.
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Volume:
56
Year:
2009
Language:
english
Pages:
8
DOI:
10.1109/ted.2009.2022698
File:
PDF, 1.16 MB
english, 2009
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