Reliability Tradeoffs and Scaling Issues of Read Drain Bias...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 9

Reliability Tradeoffs and Scaling Issues of Read Drain Bias in nor Flash Memory

Yung-Huei Lee, McMahon, W., Lu, Y.-L.R., Freidin, Z.
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Volume:
56
Year:
2009
Language:
english
Pages:
7
DOI:
10.1109/ted.2009.2027190
File:
PDF, 645 KB
english, 2009
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