Analytical and Finite-Element Modeling of a Cross Kelvin...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 10

Analytical and Finite-Element Modeling of a Cross Kelvin Resistor Test Structure for Low Specific Contact Resistivity

Holland, A.S., Reeves, G.K., Bhaskaran, M., Sriram, S.
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Volume:
56
Year:
2009
Language:
english
Pages:
5
DOI:
10.1109/ted.2009.2028623
File:
PDF, 637 KB
english, 2009
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