Physical and Electrical Characterization of...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 11

Physical and Electrical Characterization of Metal–Insulator–Metal Capacitors With and Laminated Dielectrics for Analog Circuit Applications

Jing-De Chen, Jian-Jun Yang, Wise, R., Steinmann, P., Ming-Bin Yu, Chunxiang Zhu, Yee-Chia Yeo
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Volume:
56
Year:
2009
Language:
english
Pages:
9
DOI:
10.1109/ted.2009.2030539
File:
PDF, 1.51 MB
english, 2009
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