The -Junction as the Key to Improved Ruggedness and Soft...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 11

The -Junction as the Key to Improved Ruggedness and Soft Recovery of Power Diodes

Lutz, J., Baburske, R., Min Chen, Heinze, B., Domeij, M., Felsl, H.-P., Schulze, H.-J.
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Volume:
56
Year:
2009
Language:
english
Pages:
8
DOI:
10.1109/ted.2009.2031019
File:
PDF, 1.23 MB
english, 2009
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