Self-Heating Effect on Bias-Stressed Reliability for...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 3

Self-Heating Effect on Bias-Stressed Reliability for Low-Temperature a-Si:H TFT on Flexible Substrate

Shih-Chin Kao, Hsiao-Wen Zan, Jung-Jie Huang, Bo-Cheng Kung
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Volume:
57
Year:
2010
Language:
english
Pages:
6
DOI:
10.1109/ted.2009.2039261
File:
PDF, 491 KB
english, 2010
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