Improvement of Poly-Pimple-Induced Device Mismatch on...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 4

Improvement of Poly-Pimple-Induced Device Mismatch on 6T-SRAM at 65-nm CMOS Technology

Chan-Yuan Hu, Chen, J.F., Shih-Chih Chen, Shoou-Jinn Chang, Kay-Ming Lee, Chih-Ping Lee
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Volume:
57
Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/ted.2010.2041285
File:
PDF, 545 KB
english, 2010
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