Investigation of the Failure Mechanism for an S-Band...

Investigation of the Failure Mechanism for an S-Band Pillbox Output Window Applied in High-Average-Power Klystrons

Fang Zhu, Zhao-Chuan Zhang, Ji-Run Luo, Yu-Wen Zhang
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Volume:
57
Year:
2010
Language:
english
Pages:
6
DOI:
10.1109/ted.2010.2041874
File:
PDF, 481 KB
english, 2010
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