Reduction of RTS Noise in Small-Area MOSFETs Under Switched Bias Conditions and Forward Substrate Bias
Zanolla, N., Siprak, D., Tiebout, M., Baumgartner, P., Sangiorgi, E., Fiegna, C.Volume:
57
Year:
2010
Language:
english
Pages:
10
DOI:
10.1109/ted.2010.2043554
File:
PDF, 343 KB
english, 2010