A Practical Model Assessing the Degradation of Polycrystalline Silicon TFTs Due to DC Electrical Stress
Kontogiannopoulos, G.P., Farmakis, F.V., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.Volume:
57
Year:
2010
Language:
english
Pages:
9
DOI:
10.1109/ted.2010.2046107
File:
PDF, 559 KB
english, 2010