A Practical Model Assessing the Degradation of...

A Practical Model Assessing the Degradation of Polycrystalline Silicon TFTs Due to DC Electrical Stress

Kontogiannopoulos, G.P., Farmakis, F.V., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.
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Volume:
57
Year:
2010
Language:
english
Pages:
9
DOI:
10.1109/ted.2010.2046107
File:
PDF, 559 KB
english, 2010
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