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A Methodology for Extraction of the Density of Interface States in the Presence of Frequency Dispersion via the Conductance Technique
Sicre, S., De Souza, M.M.Volume:
57
Year:
2010
Language:
english
Pages:
9
DOI:
10.1109/ted.2010.2049208
File:
PDF, 1.05 MB
english, 2010