Enhancement of the Electrical Safe Operating Area of Integrated DMOS Transistors With Respect to High-Energy Short Duration Pulses
Podgaynaya, A., Pogany, D., Gornik, E., Stecher, M.Volume:
57
Year:
2010
Language:
english
Pages:
6
DOI:
10.1109/ted.2010.2069564
File:
PDF, 830 KB
english, 2010