Enhancement of the Electrical Safe Operating Area of...

Enhancement of the Electrical Safe Operating Area of Integrated DMOS Transistors With Respect to High-Energy Short Duration Pulses

Podgaynaya, A., Pogany, D., Gornik, E., Stecher, M.
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Volume:
57
Year:
2010
Language:
english
Pages:
6
DOI:
10.1109/ted.2010.2069564
File:
PDF, 830 KB
english, 2010
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