Effects of Short-Term DC-Bias-Induced Stress on...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 11

Effects of Short-Term DC-Bias-Induced Stress on n-GaN/AlGaN/GaN MOSHEMTs With Liquid-Phase-Deposited as a Gate Dielectric

Basu, S., Singh, P.K., Shun-Kuan Lin, Po-Wen Sze, Yeong-Her Wang
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Volume:
57
Year:
2010
Language:
english
Pages:
10
DOI:
10.1109/ted.2010.2071130
File:
PDF, 1.18 MB
english, 2010
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