A New 20 V-Rated Buried-Oxide Trench-Gate Bipolar-Mode JFET...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 12

A New 20 V-Rated Buried-Oxide Trench-Gate Bipolar-Mode JFET FOR DC/DC Converters

Bo Tian, Yu Wu, Huai Huang, Lingpeng Guan, Sin, J.K.O., Baowei Kang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
57
Year:
2010
Language:
english
Pages:
5
DOI:
10.1109/ted.2010.2076090
File:
PDF, 451 KB
english, 2010
Conversion to is in progress
Conversion to is failed