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Transistor Mismatch Properties in Deep-Submicrometer CMOS...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 2

Transistor Mismatch Properties in Deep-Submicrometer CMOS Technologies

Xiaobin Yuan, Shimizu, T., Mahalingam, U., Brown, J.S., Habib, K.Z., Tekleab, D.G., Tai-Chi Su, Satadru, S., Olsen, C.M., Hyunwoo Lee, Li-Hong Pan, Hook, T.B., Jin-Ping Han, Jae-Eun Park, Myung-Hee Na
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Volume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/ted.2010.2090159
File:
PDF, 722 KB
english, 2011
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