Mechanism of Long-Channel Drain-Induced Barrier Lowering in...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 4

Mechanism of Long-Channel Drain-Induced Barrier Lowering in Halo MOSFETs

Roy, A.S., Mudanai, S.P., Stettler, M.
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Volume:
58
Year:
2011
Language:
english
Pages:
6
DOI:
10.1109/ted.2011.2109387
File:
PDF, 187 KB
english, 2011
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