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Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization
Runsheng Wang, Jing Zhuge, Ru Huang, Tao Yu, Jibin Zou, Dong-Won Kim, Donggun Park, Yangyuan WangVolume:
58
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/ted.2011.2115246
File:
PDF, 1.38 MB
english, 2011