Investigation on Variability in Metal-Gate Si Nanowire...

Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization

Runsheng Wang, Jing Zhuge, Ru Huang, Tao Yu, Jibin Zou, Dong-Won Kim, Donggun Park, Yangyuan Wang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
58
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/ted.2011.2115246
File:
PDF, 1.38 MB
english, 2011
Conversion to is in progress
Conversion to is failed