Off-State Degradation of High-Voltage-Tolerant nLDMOS-SCR ESD Devices
Griffoni, A., Shih-Hung Chen, Thijs, S., Kaczer, B., Franco, J., Linten, D., De Keersgieter, A., Groeseneken, G.Volume:
58
Year:
2011
Language:
english
Pages:
11
DOI:
10.1109/ted.2011.2132760
File:
PDF, 1.49 MB
english, 2011