Low-Frequency Noise Investigation and Noise Variability...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 8

Low-Frequency Noise Investigation and Noise Variability Analysis in High-/Metal Gate 32-nm CMOS Transistors

Lopez, D., Haendler, S., Leyris, C., Bidal, G., Ghibaudo, G.
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Volume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1109/ted.2011.2141139
File:
PDF, 553 KB
english, 2011
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