Characterization of Border Trap Density With the Multifrequency Charge Pumping Technique in Dual-Layer Gate Oxide
Younghwan Son, Sunyoung Park, Taewook Kang, Byoungchan Oh, Hyungcheol ShinVolume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1109/ted.2011.2157931
File:
PDF, 913 KB
english, 2011