Layout-Dependent Stress Effect on High-Frequency Characteristics and Flicker Noise in Multifinger and Donut MOSFETs
Kuo-Liang Yeh, Jyh-Chyurn GuoVolume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1109/ted.2011.2159223
File:
PDF, 790 KB
english, 2011