On the Origin of Thermal Runaway in a Trench Power MOSFET

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 10

On the Origin of Thermal Runaway in a Trench Power MOSFET

Dibra, D., Stecher, M., Decker, S., Lindemann, A., Lutz, J., Kadow, C.
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Volume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/ted.2011.2160867
File:
PDF, 766 KB
english, 2011
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