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Comparison of SOI and Partial-SOI LDMOSFETs Using Electrical–Thermal–Stress Coupled-Field Effect
Cher Ming Tan, Guangyu HuangVolume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1109/ted.2011.2162588
File:
PDF, 663 KB
english, 2011