Deterministic Method to Evaluate the Threshold Voltage...

IEEE Transactions on Electron Devices 2012 Vol. 59; Iss. 5

Deterministic Method to Evaluate the Threshold Voltage Variability Induced by Discrete Trap Charges in Si-Nanowire FETs

Bekaddour, A., Pala, M.G., Chabane-Sari, N., Ghibaudo, G.
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Volume:
59
Year:
2012
Language:
english
Pages:
6
DOI:
10.1109/ted.2012.2186575
File:
PDF, 636 KB
english, 2012
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