Effects of Plasma- Passivation on Mobility Degradation Mechanisms of nMOSFETs
Suleiman, S.A.B., Hoon-Jung Oh, Sungjoo LeeVolume:
59
Year:
2012
Language:
english
Pages:
8
DOI:
10.1109/ted.2012.2187209
File:
PDF, 1.01 MB
english, 2012